Data Publication: Data from NIST IR "Report on VAMAS Round Robin of ISO 13067: Microbeam Analysis - Electron Backscatter Diffraction - Measurement of Average Grain Size"
This data publication includes electron backscatter diffraction (EBSD) data used to support the development of ISO 13067 "Microbeam Analysis - Electron Backscatter Diffraction - Measurement of Average Grain Size" as part of a Versailles Project on Advanced Materials and Standards (VAMAS) work area. EBSD data was …